| DUT - device under test | | | Related- EW - Electronic Warfare
- MIT - Massachusetts Institute of Technology
- NTIS - National Technical Information Service
- IEEE - Institute of Electrical and Electronics Engineers
- LCD - Liquid Crystal Display
- DEC - Digital Equipment Corporation
- CRT - Cathode Ray Tube
- DSP - Digital Signal Processor
- OEM - Original Equipment Manufacturer
- SAIC - Science Applications International Corporation
- EIA - Electronic Industries Association
- ASME - American Society of Mechanical Engineers
- IC - integrated circuit
- LED - Light Emitting Diode
- SAE - Society of Automotive Engineers
- Laser - Light Amplification by Stimulated Emission of Radiation
- PCB - Printed Circuit Board
- PLC - Programmable Logic Controller
- RFI - Radio Frequency Interference
- TC - Technical Committee
- ESS - Electronic Switching System
- EFF - Electronic Frontier Foundation
- PERT - Program Evaluation and Review Technique
- CES - Consumer Electronics Show
- PLD - programmable logic device
- SAW - Surface Acoustic Wave
- PAL - Programmable Array Logic
- ECO - Engineering Change Order
- MAP - Manufacturing Automation Protocol
- ECN - Engineering Change Notice
Relevant LinksWhat most visitors search for before coming to this pageWhat is DUT?One of the definitions of DUT is "device under test".How to abbreviate device under test? What is the abbreviation for device under test?"device under test" is abbreviated as DUT.What is the meaning of DUT acronym?The meaning of DUT acronym is "device under test".What does DUT acronym stand for?DUT stands for "device under test".What does DUT mean?Acronym DUT means "device under test".
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| APA | Device Under Test. (2009, November 25). In All Acronyms. Retrieved 19:42, November 25, 2009, from http://www.all-acronyms.com/DUT/device_under_test/30344 | | MLA | "Device Under Test." All Acronyms. 25 Nov 2009, 19:42. All Acronyms. 25 Nov 2009 <http://www.all-acronyms.com/DUT/device_under_test/30344>. | | MHRA | 'Device Under Test', All Acronyms, 25 November 2009, 19:42, <http://www.all-acronyms.com/DUT/device_under_test/30344> [accessed 25 November 2009] | | Chicago | "Device Under Test," http://www.all-acronyms.com/DUT/device_under_test/30344 (accessed November 25, 2009). | | CBE/CSE | Device Under Test [Internet]. All Acronyms; 2009 Nov 25, 19:42 [cited 2009 Nov 25]. Available from: http://www.all-acronyms.com/DUT/device_under_test/30344. | | Bluebook | Device Under Test, http://www.all-acronyms.com/DUT/device_under_test/30344 (last visited November 25, 2009). | | Bluebook: Harvard JOLT | See All Acronyms, Device Under Test, http://www.all-acronyms.com/DUT/device_under_test/30344 (optional description here) (as of Nov. 25, 2009, 19:42). | | AMA | Device Under Test. All Acronyms. November 25, 2009, 19:42. Available at: http://www.all-acronyms.com/DUT/device_under_test/30344. Accessed November 25, 2009. |
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